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New PDF release: Advances in atomic spectroscopy. / Volume 2

By J. Sneddon

ISBN-10: 0080546374

ISBN-13: 9780080546377

ISBN-10: 1281026816

ISBN-13: 9781281026811

This sequence describes chosen advances within the sector of atomic spectroscopy. it's promarily meant for the reader who has a historical past in atmoic spectroscopy; appropriate to the amateur and professional. even if a general and accredited process for steel and non-metal research in various complicated samples, Advances in Atomic Spectroscopy covers quite a lot of fabrics. each one bankruptcy will thoroughly disguise a space of atomic spectroscopy the place fast improvement has occurred.

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Additional info for Advances in atomic spectroscopy. / Volume 2

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Conclusion Several background correction techniques have been developed for graphite furnace LEAFS. For most of the samples analyzed to date, the manual method of measuring background a short distance away from the analytical wavelength is adequate. However, this technique cannot correct for large background signals, or Table 13. 5 Notes: *All dissolved samples diluted 1:5. **Non-certified value. Results are reported as + one standard deviation. 2 mg of palladium were used as a matrix modifier.

Detection limits obtained for cobalt and lead are listed in Table 11. For both elements, with the etalon-narrowed laser, the ZETA LEAFS detection limits were within a factor of two of the LEAFS detection limits, indicating that absorption of light by the ~ components with the field on has been minimized. Figure 25 shows calibration curves for cobalt by LEAFS and ZETA LEAFS. The curves were nearly identical, indicating that t~ component broadening was inconsequential owing to the favorable o component splittings.

It is time-consuming, and would not be expected to work well with relatively large background levels or with structured backgrounds. Liang et al. (1993) reported the presence of structured backgrounds in their work involving the determination of antimony and tellurium in nickel-based alloys. An excitation spectral scan of tellurium in an aqueous standard and in the dissolved sample revealed the presence of a structured background signal in the sample (Figure 14). 243 nm, did not match exactly any known atomic line and its origin could not be determined.

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Advances in atomic spectroscopy. / Volume 2 by J. Sneddon

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